Eric Lifshin: search on Z-Library

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1

Scanning Electron Microscopy and X-ray Microanalysis || The SEM and Its Modes of Operation

Goldstein, Joseph I., Newbury, Dale E., Echlin, Patrick, Joy, David C., Lyman, Charles E., Lifshin, Eric, Sawyer, Linda, Michael, Joseph R.

Year:

2003

Language:

english

File:

PDF, 2.86 MB

english, 2003

2

Scanning Electron Microscopy and X-ray Microanalysis || Quantitative X-Ray Analysis: The Basics

Goldstein, Joseph I., Newbury, Dale E., Echlin, Patrick, Joy, David C., Lyman, Charles E., Lifshin, Eric, Sawyer, Linda, Michael, Joseph R.

Year:

2003

Language:

english

File:

PDF, 2.51 MB

english, 2003

3

Scanning Electron Microscopy and X-ray Microanalysis || Special Topics in Electron Beam X-Ray Microanalysis

Goldstein, Joseph I., Newbury, Dale E., Echlin, Patrick, Joy, David C., Lyman, Charles E., Lifshin, Eric, Sawyer, Linda, Michael, Joseph R.

Year:

2003

Language:

english

File:

PDF, 4.42 MB

english, 2003

4

Scanning Electron Microscopy and X-ray Microanalysis || Special Topics in Scanning Electron Microscopy

Goldstein, Joseph I., Newbury, Dale E., Echlin, Patrick, Joy, David C., Lyman, Charles E., Lifshin, Eric, Sawyer, Linda, Michael, Joseph R.

Year:

2003

Language:

english

File:

PDF, 4.23 MB

english, 2003

5

Scanning Electron Microscopy and X-ray Microanalysis || Generation of X-Rays in the SEM Specimen

Goldstein, Joseph I., Newbury, Dale E., Echlin, Patrick, Joy, David C., Lyman, Charles E., Lifshin, Eric, Sawyer, Linda, Michael, Joseph R.

Year:

2003

Language:

english

File:

PDF, 1.99 MB

english, 2003

6

Statistical Considerations in Microanalysis by Energy-Dispersive Spectrometry

Lifshin, Eric, Doganaksoy, Necip, Sirois, Jane, Gauvin, Raynald

Journal:

Microscopy and Microanalysis

Year:

1998

Language:

english

File:

PDF, 1.11 MB

english, 1998

7

Precision and Detection Limits for EDS Analysis in the SEM

Lifshin, Eric, Gauvin, Raynald

Journal:

Microscopy Today

Year:

2003

Language:

english

File:

PDF, 8.04 MB

english, 2003

8

X-ray Characterization of Materials Volume 203 (Lifshin/X-ray) ||

Year:

1999

Language:

english

File:

PDF, 396 KB

english, 1999

9

Scanning Electron Microscopy and X-ray Microanalysis || Procedures for Elimination of Charging in Nonconducting Specimens

Goldstein, Joseph I., Newbury, Dale E., Echlin, Patrick, Joy, David C., Lyman, Charles E., Lifshin, Eric, Sawyer, Linda, Michael, Joseph R.

Year:

2003

Language:

english

File:

PDF, 2.39 MB

english, 2003

10

Scanning Electron Microscopy and X-ray Microanalysis || Ambient-Temperature Specimen Preparation of Biological Material

Goldstein, Joseph I., Newbury, Dale E., Echlin, Patrick, Joy, David C., Lyman, Charles E., Lifshin, Eric, Sawyer, Linda, Michael, Joseph R.

Year:

2003

Language:

english

File:

PDF, 2.60 MB

english, 2003

11

Scanning Electron Microscopy and X-ray Microanalysis || Specimen Preparation of Hard Materials: Metals, Ceramics, Rocks, Minerals, Microelectronic and Packaged Devices, Particles, and Fibers

Goldstein, Joseph I., Newbury, Dale E., Echlin, Patrick, Joy, David C., Lyman, Charles E., Lifshin, Eric, Sawyer, Linda, Michael, Joseph R.

Year:

2003

Language:

english

File:

PDF, 2.03 MB

english, 2003

12

Scanning Electron Microscopy and X-ray Microanalysis || X-Ray Spectral Measurement: EDS and WDS

Goldstein, Joseph I., Newbury, Dale E., Echlin, Patrick, Joy, David C., Lyman, Charles E., Lifshin, Eric, Sawyer, Linda, Michael, Joseph R.

Year:

2003

Language:

english

File:

PDF, 2.94 MB

english, 2003

13

Scanning Electron Microscopy and X-ray Microanalysis || Specimen Preparation of Polymer Materials

Goldstein, Joseph I., Newbury, Dale E., Echlin, Patrick, Joy, David C., Lyman, Charles E., Lifshin, Eric, Sawyer, Linda, Michael, Joseph R.

Year:

2003

Language:

english

File:

PDF, 2.84 MB

english, 2003

14

Scanning Electron Microscopy and X-Ray Microanalysis || Qualitative X-Ray Analysis

Goldstein, Joseph I., Newbury, Dale E., Echlin, Patrick, Joy, David C., Romig, A. D., Lyman, Charles E., Fiori, Charles, Lifshin, Eric

Year:

1992

Language:

english

File:

PDF, 3.51 MB

english, 1992

15

Scanning Electron Microscopy and X-Ray Microanalysis || X-Ray Peak and Background Measurements

Goldstein, Joseph I., Newbury, Dale E., Echlin, Patrick, Joy, David C., Romig, A. D., Lyman, Charles E., Fiori, Charles, Lifshin, Eric

Year:

1992

Language:

english

File:

PDF, 4.50 MB

english, 1992

16

Scanning Electron Microscopy and X-Ray Microanalysis || Coating and Conductivity Techniques for SEM and Microanalysis

Goldstein, Joseph I., Newbury, Dale E., Echlin, Patrick, Joy, David C., Romig, A. D., Lyman, Charles E., Fiori, Charles, Lifshin, Eric

Year:

1992

Language:

english

File:

PDF, 11.29 MB

english, 1992

17

Scanning Electron Microscopy and X-Ray Microanalysis ||

Goldstein, Joseph I., Newbury, Dale E., Echlin, Patrick, Joy, David C., Romig, A. D., Lyman, Charles E., Fiori, Charles, Lifshin, Eric

Year:

1992

Language:

english

File:

PDF, 128.83 MB

english, 1992

18

Scanning Electron Microscopy and X-Ray Microanalysis || Image Formation in the Scanning Electron Microscope

Goldstein, Joseph I., Newbury, Dale E., Echlin, Patrick, Joy, David C., Fiori, Charles, Lifshin, Eric

Year:

1981

Language:

english

File:

PDF, 8.00 MB

english, 1981

19

WinX-Ray: A New Monte Carlo Program for the Simulation of X-Ray and Charging Materials

Demers, Hendrix, Horny, Paula, Gauvin, Raynald, Lifshin, Eric

Journal:

Microscopy and Microanalysis

Year:

2002

Language:

english

File:

PDF, 239 KB

english, 2002

20

Electron Microprobe Analysis. S. J. B. Reed, Cambridge University Press, 1975. 400 pp. $34.50

Journal:

X-Ray Spectrometry

Year:

1977

Language:

english

File:

PDF, 112 KB

english, 1977

21

X-Ray Microanalysis of Real Materials Using Monte Carlo Simulations

Raynald Gauvin, Eric Lifshin

Journal:

Microchimica Acta

Year:

2004

Language:

english

File:

PDF, 272 KB

english, 2004

22

Two minds on the solid surface

Burrell, Michael C., Lifshin, Eric

Journal:

Year:

1987

File:

PDF, 145 KB

1987

23

Scanning Electron Microscopy and X-ray Microanalysis || Image Formation and Interpretation

Goldstein, Joseph I., Newbury, Dale E., Echlin, Patrick, Joy, David C., Lyman, Charles E., Lifshin, Eric, Sawyer, Linda, Michael, Joseph R.

Year:

2003

Language:

english

File:

PDF, 4.55 MB

english, 2003

24

Scanning Electron Microscopy and X-ray Microanalysis || Electron Beam–Specimen Interactions

Goldstein, Joseph I., Newbury, Dale E., Echlin, Patrick, Joy, David C., Lyman, Charles E., Lifshin, Eric, Sawyer, Linda, Michael, Joseph R.

Year:

2003

Language:

english

File:

PDF, 2.38 MB

english, 2003

25

Scanning Electron Microscopy and X-ray Microanalysis || Qualitative X-Ray Analysis

Goldstein, Joseph I., Newbury, Dale E., Echlin, Patrick, Joy, David C., Lyman, Charles E., Lifshin, Eric, Sawyer, Linda, Michael, Joseph R.

Year:

2003

Language:

english

File:

PDF, 2.38 MB

english, 2003

26

Scanning Electron Microscopy and X-ray Microanalysis ||

Goldstein, Joseph I., Newbury, Dale E., Echlin, Patrick, Joy, David C., Lyman, Charles E., Lifshin, Eric, Sawyer, Linda, Michael, Joseph R.

Year:

2003

Language:

english

File:

PDF, 1.99 MB

english, 2003

27

Scanning Electron Microscopy and X-ray Microanalysis || Low-Temperature Specimen Preparation

Goldstein, Joseph I., Newbury, Dale E., Echlin, Patrick, Joy, David C., Lyman, Charles E., Lifshin, Eric, Sawyer, Linda, Michael, Joseph R.

Year:

2003

Language:

english

File:

PDF, 2.35 MB

english, 2003

28

Development of a New Quantitative X-Ray Microanalysis Method for Electron Microscopy

Horny, Paula, Lifshin, Eric, Campbell, Helen, Gauvin, Raynald

Journal:

Microscopy and Microanalysis

Year:

2010

Language:

english

File:

PDF, 218 KB

english, 2010

29

Scanning Electron Microscopy and X-ray Microanalysis || Introduction

Goldstein, Joseph I., Newbury, Dale E., Echlin, Patrick, Joy, David C., Lyman, Charles E., Lifshin, Eric, Sawyer, Linda, Michael, Joseph R.

Year:

2003

Language:

english

File:

PDF, 2.51 MB

english, 2003

30

Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy || || Front_matter

Lyman, Charles E., Goldstein, Joseph I., Romig, Alton D., Echlin, Patrick, Joy, David C., Newbury, Dale E., Williams, David B., Armstrong, John T., Fiori, Charles E., Lifshin, Eric, Peters, Klaus-Rued

Year:

1990

Language:

english

File:

PDF, 877 KB

english, 1990

31

Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy || Basic SEM Imaging

Lyman, Charles E., Goldstein, Joseph I., Romig, Alton D., Echlin, Patrick, Joy, David C., Newbury, Dale E., Williams, David B., Armstrong, John T., Fiori, Charles E., Lifshin, Eric, Peters, Klaus-Rued

Year:

1990

Language:

english

File:

PDF, 1.14 MB

english, 1990

32

Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy || Electron Beam Parameters

Lyman, Charles E., Goldstein, Joseph I., Romig, Alton D., Echlin, Patrick, Joy, David C., Newbury, Dale E., Williams, David B., Armstrong, John T., Fiori, Charles E., Lifshin, Eric, Peters, Klaus-Rued

Year:

1990

Language:

english

File:

PDF, 1.36 MB

english, 1990

33

Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy || Backscattered Electron Imaging

Lyman, Charles E., Goldstein, Joseph I., Romig, Alton D., Echlin, Patrick, Joy, David C., Newbury, Dale E., Williams, David B., Armstrong, John T., Fiori, Charles E., Lifshin, Eric, Peters, Klaus-Rued

Year:

1990

Language:

english

File:

PDF, 929 KB

english, 1990

34

Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy || Scanning Transmission Imaging in the SEM

Lyman, Charles E., Goldstein, Joseph I., Romig, Alton D., Echlin, Patrick, Joy, David C., Newbury, Dale E., Williams, David B., Armstrong, John T., Fiori, Charles E., Lifshin, Eric, Peters, Klaus-Rued

Year:

1990

Language:

english

File:

PDF, 440 KB

english, 1990

35

Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy || Light Element Microanalysis

Lyman, Charles E., Goldstein, Joseph I., Romig, Alton D., Echlin, Patrick, Joy, David C., Newbury, Dale E., Williams, David B., Armstrong, John T., Fiori, Charles E., Lifshin, Eric, Peters, Klaus-Rued

Year:

1990

Language:

english

File:

PDF, 885 KB

english, 1990

36

Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy || Image Contrast and Quality

Lyman, Charles E., Goldstein, Joseph I., Romig, Alton D., Echlin, Patrick, Joy, David C., Newbury, Dale E., Williams, David B., Armstrong, John T., Fiori, Charles E., Lifshin, Eric, Peters, Klaus-Rued

Year:

1990

Language:

english

File:

PDF, 1.21 MB

english, 1990

37

Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy || Stereo Microscopy

Lyman, Charles E., Goldstein, Joseph I., Romig, Alton D., Echlin, Patrick, Joy, David C., Newbury, Dale E., Williams, David B., Armstrong, John T., Fiori, Charles E., Lifshin, Eric, Peters, Klaus-Rued

Year:

1990

Language:

english

File:

PDF, 1.21 MB

english, 1990

38

Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy || Energy-Dispersive X-Ray Spectrometry

Lyman, Charles E., Goldstein, Joseph I., Romig, Alton D., Echlin, Patrick, Joy, David C., Newbury, Dale E., Williams, David B., Armstrong, John T., Fiori, Charles E., Lifshin, Eric, Peters, Klaus-Rued

Year:

1990

Language:

english

File:

PDF, 1.11 MB

english, 1990

39

Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy || High-Resolution SEM Imaging

Lyman, Charles E., Goldstein, Joseph I., Romig, Alton D., Echlin, Patrick, Joy, David C., Newbury, Dale E., Williams, David B., Armstrong, John T., Fiori, Charles E., Lifshin, Eric, Peters, Klaus-Rued

Year:

1990

Language:

english

File:

PDF, 1.19 MB

english, 1990

40

Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy || SE Signal Components

Lyman, Charles E., Goldstein, Joseph I., Romig, Alton D., Echlin, Patrick, Joy, David C., Newbury, Dale E., Williams, David B., Armstrong, John T., Fiori, Charles E., Lifshin, Eric, Peters, Klaus-Rued

Year:

1990

Language:

english

File:

PDF, 1.11 MB

english, 1990

41

Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy || Wavelength-Dispersive X-Ray Spectrometry and Microanalysis

Lyman, Charles E., Goldstein, Joseph I., Romig, Alton D., Echlin, Patrick, Joy, David C., Newbury, Dale E., Williams, David B., Armstrong, John T., Fiori, Charles E., Lifshin, Eric, Peters, Klaus-Rued

Year:

1990

Language:

english

File:

PDF, 972 KB

english, 1990

42

Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy || Quantitative Energy-Dispersive X-Ray Microanalysis

Lyman, Charles E., Goldstein, Joseph I., Romig, Alton D., Echlin, Patrick, Joy, David C., Newbury, Dale E., Williams, David B., Armstrong, John T., Fiori, Charles E., Lifshin, Eric, Peters, Klaus-Rued

Year:

1990

Language:

english

File:

PDF, 1.44 MB

english, 1990

43

Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy || Low-Voltage SEM

Lyman, Charles E., Goldstein, Joseph I., Romig, Alton D., Echlin, Patrick, Joy, David C., Newbury, Dale E., Williams, David B., Armstrong, John T., Fiori, Charles E., Lifshin, Eric, Peters, Klaus-Rued

Year:

1990

Language:

english

File:

PDF, 811 KB

english, 1990

44

Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy || Trace Element Microanalysis

Lyman, Charles E., Goldstein, Joseph I., Romig, Alton D., Echlin, Patrick, Joy, David C., Newbury, Dale E., Williams, David B., Armstrong, John T., Fiori, Charles E., Lifshin, Eric, Peters, Klaus-Rued

Year:

1990

Language:

english

File:

PDF, 956 KB

english, 1990

45

Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy || Particle and Rough Surface Microanalysis

Lyman, Charles E., Goldstein, Joseph I., Romig, Alton D., Echlin, Patrick, Joy, David C., Newbury, Dale E., Williams, David B., Armstrong, John T., Fiori, Charles E., Lifshin, Eric, Peters, Klaus-Rued

Year:

1990

Language:

english

File:

PDF, 980 KB

english, 1990

46

Scanning Electron Microscopy and X-Ray Microanalysis || Introduction

Goldstein, Joseph I., Newbury, Dale E., Echlin, Patrick, Joy, David C., Romig, A. D., Lyman, Charles E., Fiori, Charles, Lifshin, Eric

Year:

1992

Language:

english

File:

PDF, 2.95 MB

english, 1992

47

Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy || Energy-Dispersive X-Ray Microanalysis

Lyman, Charles E., Goldstein, Joseph I., Romig, Alton D., Echlin, Patrick, Joy, David C., Newbury, Dale E., Williams, David B., Armstrong, John T., Fiori, Charles E., Lifshin, Eric, Peters, Klaus-Rued

Year:

1990

Language:

english

File:

PDF, 2.12 MB

english, 1990

48

Scanning Electron Microscopy and X-Ray Microanalysis || Electron Optics

Goldstein, Joseph I., Newbury, Dale E., Echlin, Patrick, Joy, David C., Romig, A. D., Lyman, Charles E., Fiori, Charles, Lifshin, Eric

Year:

1992

Language:

english

File:

PDF, 7.77 MB

english, 1992

49

Scanning Electron Microscopy and X-Ray Microanalysis || Electron-Specimen Interactions

Goldstein, Joseph I., Newbury, Dale E., Echlin, Patrick, Joy, David C., Romig, A. D., Lyman, Charles E., Fiori, Charles, Lifshin, Eric

Year:

1992

Language:

english

File:

PDF, 11.76 MB

english, 1992

50

Scanning Electron Microscopy and X-Ray Microanalysis || X-Ray Spectral Measurement: WDS and EDS

Goldstein, Joseph I., Newbury, Dale E., Echlin, Patrick, Joy, David C., Romig, A. D., Lyman, Charles E., Fiori, Charles, Lifshin, Eric

Year:

1992

Language:

english

File:

PDF, 10.02 MB

english, 1992